Mitutoyo TM-500 Series Manual do Utilizador descarregar pdf (Página 12)

373

MICROSCOPES

Metallic

objective

micrometer

3µm Reticle

7µm Reticle

Color filter

Center

support

Holder

with clamp

V-block

with clamp

Swivel center

support

Twin fiber-optic

cable

Stage adapter

Wafer holder

Rotary table

Oblique surface

illuminator

eyepiece

M Plan Objective

0.5XTV

adapter

Digital color Vision

Polarization unit

DIC unit

Ring LED

Illumination unit

C-mount

adapter

ML

Objective

Binocular

unit

Protractor

eyepiece

Digital

Protractor

eyepiece

Double

image

eyepiece

Monocular

unit

Ring

fiber-optic

cable

Picture

composition

unit

Digital camera

adapter

Machine

stand

Focus pilot

FP-05U

Focus pilot

FP-05

Revolver

BF 4P

Revolver

BD 4P

Power

Revolver

BF 5P

Revolver

BD 4P

with sensor

Revolver

BF 4P

with sensor

Power

Revolver

BD4P

Ring LED

Illumination unit

Hyper MF Hyper MF-U

SYSTEM DIAGRAM

Polarized light observation:

Observing only the filtered light that

vibrates in one direction. Used for

observing materials with special

optical characteristics, such as

mineral and liquid crystal.

Differential interference

observation:

Effective in detecting fine scratches

and steps on the surface of metal,

liquid crystal, and semiconductors.

Bright field observation:

Most common method of

observation. Observing directly the

light reflected on the surface of

workpiece.

Dark field observation:

Observing only the scattered light by

shutting down the direct light to the

objectives. The scratches and dust

that cannot be viewed in the bright

view field can be observed by a high-

contrast.

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